Home > available-technologies >
Page 1 of 11
Feb, 03, 2010
Highly Sensitive Electrostatic Force Detection Using Small Amplitude FM-KFM

Electrostatic force microscopy (EFM) and Kelvin-probe force microscopy (KFM) are powerful methods which are capable of measuring local electric properties even at atomic/molecular resolution.

Jan, 20, 2010
Method, Apparatus and Program to Widen a Detectable Range of Frequency Shift Detector for Vibrating Materials and Frequency Modulation Atomic Force Microscopy

Phase lock loop (PLL) enables us to detect the shift of input signal frequency. In general heterodyne is used to match the input signal frequency to the center frequency of VCXO in PLL as shown in fig1.

Page 1 of 11