• available-technologies
  • Electronics and Optelectronics

Electrostatic force microscopy (EFM) and Kelvin-probe force microscopy (KFM) are powerful methods which are capable of measuring local electric properties even at atomic/molecular resolution. However, lateral and voltage resolution is not sufficient to distinguish of identify atomic/molecular species within decent time. So development of highly sensitive electrostatic force detection scheme is demanded.
In this novel method, it is shown that SA-AM-KFM has higher S/N than conventional KFM techniques theoretically and experimentally. We succeeded in obtaining molecular resolution EFM image using this novel method, SA-AM-KFM.



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